Material Analysis

Field Emission Scanning Electron Microscope (FESEM)

Key Parameters:

Secondary Electron Image Resolution: 1 nm

Maximum Magnification: 1,000,000

FunctionsThe ultra-high resolution Schottky Field Emission Scanning Electron Microscope is ideal for investigating molecular surface structures and their electronic properties, serving the field of physics, material, semiconductor, superconductor, chemistry, polymer, mineral, biology and medical science with its high throughput and high performance analysis.

Inductively Coupled Plasma Mass Spectrometer (ICP-MS)

Key Parameters:

Detection Limit: In≤0.1 ppt

Range: 1-285 amu

FunctionsThe Inductively Coupled Plasma Mass Spectrometer is capable of detecting most of the periodic table of elements at milligram to nanogram levels per liter, as well as analysing metal stable isotopes and elemental speciation.

X-ray Diffractometer (XRD)

Key Parameters:

Repeatability: 0.0001 °

Resolution: 8.6 %

FunctionsX-ray Diffractometer covers a vast range of applications from phase identification, quantitative analysis and crystal structure determination of powder samples, to small angle X-ray scattering and residual stress analysis of mesoporous materials. It enables detailed analysis of alloy, powder metallurgy material, semiconductor, ceramics, glass, catalyst, carbon fibre and other materials from fundamental research to industrial quality control.